| Title | Circuit Reliability: Major Roadblock in Future Technology? |
| Author | Organizer: Tsung-Yi Ho (National Chiao Tung University, Taiwan), Moderator: Ing-Chao Lin (National Cheng Kung University, Taiwan), Panelists: Vijaykrishnan Narayanan (Pennsylvania State University, U.S.A.), Anthony Oates (Taiwan Semiconductor Manufacturing Company, Taiwan), Ulf Schlichtmann (Technische Universität München, Germany), Yiyu Shi (Missouri University of Science and Technology, U.S.A.), Tomohiro Yoneda (National Institute of Informatics, Japan) |
| Page | p. 118 |
| Abstract | As technology scales, circuit reliability has become a major issue. This panel focuses on circuit reliability in current and future technology. Topics for discussion include the following: 1. Major reliability issues in advanced CMOS. Which is the most critical? 2. Major reliability issues in beyond CMOS technology. Any difference? 3. Major reliability issues at 3D IC, automotive, and medical electronics. Reliable hardware platform for automotive applications. 4. The role of EDA in improving circuit reliability. |
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