| Title | Circuit Reliability: Major Roadblock in Future Technology? |
| Author | Organizer: Tsung-Yi Ho (National Chiao Tung Univ., Taiwan), Moderator: Ing-Chao Lin (National Cheng Kung Univ., Taiwan), Panelists: Vijaykrishnan Narayanan (Pennsylvania State Univ., U.S.A.), Anthony Oates (TSMC, Taiwan), Ulf Schlichtmann (Tech. Univ. München, Germany), Yiyu Shi (Missouri Univ. of Science and Tech., U.S.A.), Tomohiro Yoneda (NII, Japan) |
| Page | p. 118 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |